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From: Cristina Pascual <cris.pascual.gonzalez <at> gmail.com>
Subject: Last Mile, June 5th | CfP: VALID 2011 || October 23-28, 2011 - Barcelona, Spain
Newsgroups: gmane.ietf.mmusic
Date: Wednesday 1st June 2011 01:10:07 UTC (over 5 years ago)

Please consider to contribute to and/or forward to the appropriate groups
the following opportunity to submit and publish original scientific
The submission deadline is June 5, 2011
In addition, authors of selected papers will be invited to submit extended
article versions to one of the IARIA Journals: http://www.iariajournals.org

============== VALID 2011 | Call for Papers ===============


VALID 2011: The Third International Conference on Advances in System
Testing and Validation Lifecycle

October 23-28, 2011 - Barcelona, Spain

General page: http://www.iaria.org/conferences2011/VALID11.html

Call for Papers: http://www.iaria.org/conferences2011/CfPVALID11.html

- regular papers
- short papers (work in progress)
- posters

Submission page: http://www.iaria.org/conferences2011/SubmitVALID11.html

Submission deadline: June 5th, 2011

Sponsored by IARIA, www.iaria.org

Extended versions of selected papers will be published in IARIA Journals:

Please note the Poster Forum and Work in Progress options.

The topics suggested by the conference can be discussed in term of
concepts, state of the art, research, standards, implementations, running
experiments, applications, and industrial case studies. Authors are invited
to submit complete unpublished papers, which are not under review in any
other conference or journal in the following, but not limited to, topic

All tracks are open to both research and industry contributions, in terms
of Regular papers, Posters, Work in progress, Technical/marketing/business
presentations, Demos, Tutorials, and Panels.

Before submission, please check and comply with the Editorial rules: http://www.iaria.org/editorialrules.html

VALID 2011 Topics (topics and submission details: see CfP on the site)

Robust design methodologies
Designing methodologies for robust systems; Secure software techniques;
Industrial real-time software; Defect avoidance; Cost models for robust
systems; Design for testability; Design for reliability and variability;
Design for adaptation and resilience; Design for fault-tolerance and fast
recovery; Design for manufacturability, yield and reliability; Design for
testability in the context of model-driven engineering

Vulnerability discovery and resolution
Vulnerability assessment; On-line error detection; Vulnerabilities in
hardware security; Self-calibration; Alternative inspections; Non-intrusive
vulnerability discovery methods; Embedded malware detection

Defects and Debugging
Debugging techniques; Component debug; System debug; Software debug;
Hardware debug; System debug; Power-ground defects; Full-open defects in
interconnecting lines; Physical defects in memories and microprocessors;
Zero-defect principles

Diagnosis techniques; Advances in silicon debug and diagnosis; Error
diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical
diagnostics; Testability and diagnosability; Diagnosis and testing in mo
bile environments

System and feature testing
Test strategy for systems-in-package; Testing embedded systems; Testing
high-speed systems; Testing delay and performance; Testing communication
traffic and QoS/SLA metrics; Testing robustness; Software testing; Hardware
testing; Supply-chain testing; Memory testing; Microprocessor testing;
Mixed-signal production test; Testing multi-voltage domains;
Interconnection and compatibility testing

Testing techniques and mechanisms
Fundamentals for digital and analog testing; Emerging testing
methodologies; Engineering test coverage; Designing testing suites;
Statistical testing; Functional testing; Parametric testing; Defect- and
data-driven testing; Automated testing; Embedded testing; Autonomous
self-testing; Low cost testing; Optimized testing; Testing systems and
devices; Test standards

Testing of wireless communications systems
Testing of mobile wireless communication systems; Testing of wireless
sensor networks; Testing of radio-frequency identification systems; Testing
of ad-hoc networks; Testing methods for emerging standards; Hardware-based
prototyping of wireless communication systems; Physical layer performance
verification; On-chip testing of wireless communication systems; Modeling
and simulation of wireless channels; Noise characterization and validation;
Case studies and industrial applications of test instruments;

Software verification and validation
High-speed interface verification and fault-analysis; Software testing
theory and practice; Model-based testing; Verification metrics;
Service/application specific testing; Model checking; OO software testing;
Testing embedded software; Quality assurance; Empirical studies for
verification and validation; Software inspection techniques; Software
testing tools; New approaches for software reliability verification and

Testing and validation of run-time evolving systems
Automated testing for run-time evolving systems; Testing and validation of
evolving systems; Testing and validation of self-controlled systems;
Testing compile-time versus run-time dependency for evolving systems;
On-line validation and testing of evolving at run-time systems; Modeling
for testability of evolving at run-time systems; Near real-time and
real-time monitoring of run-time evolving systems; Verification and
validation of reflective models for testing; Verification and validation of
fault tolerance in run-time evolving systems

Feature-oriented testing
Testing user interfaces and user-driven features; Privacy testing; Ontology
accuracy testing; Testing semantic matching; Testing certification
processes; Testing authentication mechanisms; Testing biometrics
methodologies and mechanisms; Testing cross-nation systems; Testing system
interoperability; Testing system safety; Testing system robustness; Testing
temporal constraints; Testing transaction-based properties; Directed energy
test capabilities /microwave, laser, etc./; Testing delay and latency

Domain-oriented testing
Testing autonomic and autonomous systems; Testing intrusion prevention
systems; Firewall testing; Information assurance testing; Testing social
network systems; Testing recommender systems; Testing biometric systems;
Testing diagnostic systems; Testing on-line systems; Testing financial
systems; Testing life threatening systems; Testing emergency systems;
Testing sensor-based systems; Testing testing systems


VALID Advisory Chairs

Andrea Baruzzo, Universit degli Studi di Udine, Italy
Cristina Seceleanu, Mlardalen University, Sweden
Mehdi Tahoori, Karlsruhe Institute of Technology (KIT), Germany
Mehmet Aksit, University of Twente - Enschede, The Netherlands

VALID 2011 Research Institute Liaison Chairs

Juho Perl, VTT Technical Research Centre of Finland, Finland
Alexander Klaus, Fraunhofer Institute for Experimental Software Engineering
(IESE), Germany
Kazumi Hatayama, Nara Institute of Science and Technology, Japan
Alin Stefanescu, University of Pitesti, Romania
Vladimir Rubanov, Institute for System Programming / Russian Academy of
Sciences (ISPRAS), Russia
Tanja Vos, Universidad Politcnica de Valencia, Spain

VALID 2011 Industry Chairs

Abel Marrero, Daimler Center for Automotive IT Innovations - Berlin,
Sebastian Wieczorek, SAP AG - Darmstadt, Germany
Eric Verhulst, Altreonic, Belgium
Committee: http://www.iaria.org/conferences2011/ComVALID11.html
CD: 7ms